59649 - Synchrotron X-Ray Diffraction to Quantify In-Situ Strain on Rare-Earth Doped Yttria-Stabilized Zirconia Thermal Barrier Coatings
The interest for multifunctional coatings that can be integrated into gas turbine engines for in-situ temperature measurements or health monitoring and without disrupting standard thermomechanical properties has been growing over the past few years. The addition of specific rare-earth dopants into standard thermal barrier ceramic top coat materials such as yttria-stabilized zirconia can provide luminescence sensing capabilities. The thermomechanical performance and durability of such smart coatings in relevant engine environments still remains to be evaluated. In this study, highly luminescent rare-earth doped yttria-stabilized zirconia and state-of-the-art yttria stabilized zirconia coatings were manufactured to characterize the effects of the embedded rare-earth dopants on coating internal strains and to quantify and compare their high temperature response using synchrotron X-ray diffraction. In-situ strain measurements were performed at intervals along the depth of the coatings to evaluate specific strain at key locations such as the interface between the rare-earth doped layer and the standard yttria-stabilized zirconia layer or at the interface with the bond coat. The results show great promise for the safe utilization of multi-functional luminescent coatings as the low concentration of rare-earth elements in the coatings was found to show limited impact on the strains, especially at temperature closer to gas turbine operating temperatures.
Synchrotron X-Ray Diffraction to Quantify In-Situ Strain on Rare-Earth Doped Yttria-Stabilized Zirconia Thermal Barrier Coatings
Paper Type
Technical Paper Publication
Description
Session: 02-03: Thermal and Environmental Barrier Coatings
Paper Number: 59649
Start Time: June 8th, 2021, 02:15 PM
Presenting Author: Quentin Fouliard
Authors: Quentin Fouliard University of Central Florida
Hossein Ebrahimi University of Central Florida
Johnathan Hernandez University of Central Florida
Khanh Vo University of Central Florida
Frank AccorneroFlorida Institute of Technology
Mary Mccay Florida Institute of Technology
Jun-Sang Park Argonne National Laboratory
Jonathan Almer Argonne National Laboratory
Ranajay Ghosh University of Central Florida
Seetha Raghavan University of Central Florida